Data was taken on WIPPI on June 2, 2015 with energy resolution: 0.110 eV

Comment for this energyscan:
Ion efficiency curves of m/z 107, m/z 92, m/z 66, m/z 42, m/z 26, and m/z 16 induced by electron attachment to hypoxanthine as a function of electron energy below 9 eV taken at an oven temperature of 453 K. Red lines are provided only to guide the eye.

This ES was published in:
Title:	Dissociative electron attachment to the gas-phase nucleobase hypoxanthine
Authors:	Denifl, Stephan; Ptasinska, Sylwia; Tanzer, Katrin; Dawley, Michele; Carmichael, Ian
Year:	2015
Journal:	The Journal of Chemical Physics
Volume:	142
Number:
Pages:	1 - 8
DOI:	10.1063/1.4921388
XSAMS-File:	Download
ASCII-File:	Download