Energyscan for C5H3N4O- from Hypoxanthin (C5H4N4O)

Data was taken on WIPPI on June 2, 2015 with energy resolution: 0.110 eV
Electron Energy (eV)
Comment for this energyscan:
Ion efficiency curve of m/z 135 for (Hyp-H)- induced by electron attachment to hypoxanthine (bottom) taken at an oven temperature of 453 K, as a function of electron energy below 4 eV and at a resolution of 110 meV.
This ES was published in:  
Title: Dissociative electron attachment to the gas-phase nucleobase hypoxanthine
Authors: Denifl, Stephan; Ptasinska, Sylwia; Tanzer, Katrin; Dawley, Michele; Carmichael, Ian
Year: 2015
Journal: The Journal of Chemical Physics
Volume: 142
Pages: 1 - 8
DOI: 10.1063/1.4921388
XSAMS-File: Download
ASCII-File: Download
Compare this scan