Energyscan for Atomic Oxygen (O)- from Hypoxanthin (C5H4N4O)

Data was taken on WIPPI on June 2, 2015 with energy resolution: 0.110 eV
1/s
Electron Energy (eV)
 
Comment for this energyscan:
Ion efficiency curves of m/z 107, m/z 92, m/z 66, m/z 42, m/z 26, and m/z 16 induced by electron attachment to hypoxanthine as a function of electron energy below 9 eV taken at an oven temperature of 453 K. Red lines are provided only to guide the eye.
This ES was published in:  
Title: Dissociative electron attachment to the gas-phase nucleobase hypoxanthine
Authors: Denifl, Stephan; Ptasinska, Sylwia; Tanzer, Katrin; Dawley, Michele; Carmichael, Ian
Year: 2015
Journal: The Journal of Chemical Physics
Volume: 142
Number:
Pages: 1 - 8
DOI: 10.1063/1.4921388
XSAMS-File: Download
ASCII-File: Download
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